SOME ADDITIONAL STUDIES OF THE APPLICATION OF CROSS-BI-SPECTRAL ANALYSIS TO SHIP RESISTANCE IN WAVES

The objective of the present work was to investigate the sampling variability of estimates of the added resistance operator which are made via cross-bi-spectral analysis. The work involved the simulation of large samples from a process similar to that of added resistance, as well as the analysis of these samples. Direct comparisons of the results with the known answer for the simulated process imply that the previously developed methods are correct, but that the required sample of random input and the resulting output needs to be longer than originally assumed. (Author)

  • Supplemental Notes:
    • See also MRIS #041489, Volume 7.
  • Corporate Authors:

    Stevens Institute of Technology

    Davidson Laboratory, Castle Point Station
    Hoboken, NJ  USA  07030
  • Authors:
    • Dalzell, J F
  • Publication Date: 1972-12

Media Info

  • Pagination: 27 p.

Subject/Index Terms

Filing Info

  • Accession Number: 00044701
  • Record Type: Publication
  • Source Agency: National Technical Information Service
  • Report/Paper Numbers: SIT-DL-72-1641 Final Rpt
  • Contract Numbers: N00014-67A-0202-0025
  • Files: TRIS
  • Created Date: Jul 31 1973 12:00AM