PROBE MEASURING SYSTEMS FOR NUMERICAL CONTROL MACHINE TOOLS

The Lockheed-California Company has followed the basic philosophy that machining by N/C should be accompanied by similar advances in inspection methods. To achieve this objective, Lockheed has been concentrating for many years on probe devices for on-machine inspection. The latest inspection method utilizes the XYZ probe system and provides fast, accurate measurements of any N/C machined surface. Patent disclosures, applications, and some awards cover all of the probes and probe systems discussed in this report.

• Corporate Authors:

  American Society of Tool & Manufacturing Engineers

  20501 Ford Road
  Dearborn, MI  United States  48128
• Authors:
  • Shields, M G
  • Mosesian, B
• Publication Date: 1969-3-10

Media Info

• Pagination: 12 p.

Subject/Index Terms

• TRT Terms: Numerical control; Probes (Measuring devices); Quality control
• Old TRIS Terms: Probe devices
• Subject Areas: Marine Transportation;

Filing Info

• Accession Number: 00015206
• Record Type: Publication
• Source Agency: Engineering Index
• Report/Paper Numbers: IQ69-702 Tech Pap
• Files: TRIS
• Created Date: May 7 1973 12:00AM