PROBE MEASURING SYSTEMS FOR NUMERICAL CONTROL MACHINE TOOLS

The Lockheed-California Company has followed the basic philosophy that machining by N/C should be accompanied by similar advances in inspection methods. To achieve this objective, Lockheed has been concentrating for many years on probe devices for on-machine inspection. The latest inspection method utilizes the XYZ probe system and provides fast, accurate measurements of any N/C machined surface. Patent disclosures, applications, and some awards cover all of the probes and probe systems discussed in this report.

  • Corporate Authors:

    American Society of Tool & Manufacturing Engineers

    20501 Ford Road
    Dearborn, MI  USA  48128
  • Authors:
    • Shields, M G
    • Mosesian, B
  • Publication Date: 1969-3-10

Media Info

  • Pagination: 12 p.

Subject/Index Terms

Filing Info

  • Accession Number: 00015206
  • Record Type: Publication
  • Source Agency: Engineering Index
  • Report/Paper Numbers: IQ69-702 Tech Pap
  • Files: TRIS
  • Created Date: May 7 1973 12:00AM