Automotive electronics can fail because of particles from outer space

Vehicle designers are turning to field programmable gate arrays (FPGAs) as a flexible low-cost method for next-generation automotive electronics designs. The need for component reliability data is essential to ensure the proper function of the various systems in modern vehicles. Neutron-induced firm errors are a significant problem. The single-event upsets caused by neutrons inside integrated circuits can occur in any type of volatile memory cells e.g. static random access memory (SRAM)-based FPGA. The implications of such errors for automobile designers are considered. Neutron-induced firm errors can contribute to the overall system failure in time rate. Antifuse and flash FPGA technologies are immune to the effects of neutron-induced soft and firm errors.(A)


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  • Accession Number: 01043368
  • Record Type: Publication
  • Source Agency: Transport Research Laboratory
  • Files: ITRD
  • Created Date: Mar 6 2007 8:58AM