Automotive electronics can fail because of particles from outer space

Vehicle designers are turning to field programmable gate arrays (FPGAs) as a flexible low-cost method for next-generation automotive electronics designs. The need for component reliability data is essential to ensure the proper function of the various systems in modern vehicles. Neutron-induced firm errors are a significant problem. The single-event upsets caused by neutrons inside integrated circuits can occur in any type of volatile memory cells e.g. static random access memory (SRAM)-based FPGA. The implications of such errors for automobile designers are considered. Neutron-induced firm errors can contribute to the overall system failure in time rate. Antifuse and flash FPGA technologies are immune to the effects of neutron-induced soft and firm errors.(A)

• Availability:
  • Find a library where document is available. Order URL: http://worldcat.org/issn/17491819
• Authors:
  • MASON, M
• Publication Date: 2006-6

Language

• English

Media Info

• Pagination: 25-27
• Serial:
  • AUTOMOTIVE ELECTRONICS
  • Publisher: MT PUBLICATIONS LIMITED
  • ISSN: 1749-1819

Subject/Index Terms

• TRT Terms: Automobiles; Control; Design; Electronics; Equipment; Failure; Intelligent transportation systems; Vehicles
• ITRD Terms: 1243: Car; 3874: Control; 9011: Design (overall design); 6965: Electronics; 3674: Equipment; 5520: Failure; 8735: Intelligent transport system; 1255: Vehicle
• Subject Areas: Design; Operations and Traffic Management; Vehicles and Equipment; I90: Vehicles; I91: Vehicle Design and Safety;

Filing Info

• Accession Number: 01043368
• Record Type: Publication
• Source Agency: Transport Research Laboratory
• Files: ITRD
• Created Date: Mar 6 2007 8:58AM