Automotive electronics can fail because of particles from outer space
Vehicle designers are turning to field programmable gate arrays (FPGAs) as a flexible low-cost method for next-generation automotive electronics designs. The need for component reliability data is essential to ensure the proper function of the various systems in modern vehicles. Neutron-induced firm errors are a significant problem. The single-event upsets caused by neutrons inside integrated circuits can occur in any type of volatile memory cells e.g. static random access memory (SRAM)-based FPGA. The implications of such errors for automobile designers are considered. Neutron-induced firm errors can contribute to the overall system failure in time rate. Antifuse and flash FPGA technologies are immune to the effects of neutron-induced soft and firm errors.(A)
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Availability:
- Find a library where document is available. Order URL: http://worldcat.org/issn/17491819
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Authors:
- MASON, M
- Publication Date: 2006-6
Language
- English
Media Info
- Pagination: 25-27
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Serial:
- AUTOMOTIVE ELECTRONICS
- Publisher: MT PUBLICATIONS LIMITED
- ISSN: 1749-1819
Subject/Index Terms
- TRT Terms: Automobiles; Control; Design; Electronics; Equipment; Failure; Intelligent transportation systems; Vehicles
- ITRD Terms: 1243: Car; 3874: Control; 9011: Design (overall design); 6965: Electronics; 3674: Equipment; 5520: Failure; 8735: Intelligent transport system; 1255: Vehicle
- Subject Areas: Design; Operations and Traffic Management; Vehicles and Equipment; I90: Vehicles; I91: Vehicle Design and Safety;
Filing Info
- Accession Number: 01043368
- Record Type: Publication
- Source Agency: Transport Research Laboratory
- Files: ITRD
- Created Date: Mar 6 2007 8:58AM