VEHIL : A FULL-SCALE TEST METHODOLOGY FOR INTELLIGENT TRANSPORT SYSTEMS, VEHICLES AND SUBSYSTEMS
abstract pending
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Supplemental Notes:
- Publication Date: 2000. IEEE Service Center, Piscataway NJ
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Corporate Authors:
Universite de Haute-Alsace
,Audi AG
,Honda Gijutsu Kenkyujo
,Crain Communications, Incorporated
1155 Gratiot Avenue
Detroit, MI United States 48207-2997Universita di Parma Dipartimento di ingegneria dell informazione
,KOYO SEIKO CO LTD
,California State University, Sacramento
Department of Electrical and Electronic Engineering Department
Sacramento, CA United States 95819-6019Science Applications International Corporation
8301 Greensboro Drive
McLean, VA United States 22102University of Michigan, Ann Arbor
Department of Electrical Engineering and Computer Science
Ann Arbor, MI United States 48109United States. Army-Tank Automotive Command
,Toyota Chuo Kenkyujo
,Fraunhofer Institute of Microelectronic Circuits and Systems
,DaimlerChrysler Research and Technology Center North America
,Universitat der Bundeswehr Hamburg (Germany). Institut fur Automatisierungstechnik
,Hittite Microwave Corporation
,Daihatsu Jidosha Kabushiki Kaisha
,University of California, Berkeley
California PATH Program, Institute of Transportation Studies
Richmond Field Station, 1357 South 46th Street
Richmond, CA United States 94804-4648Nanyang Technological University
School of Mechanical and Production Engineering
Singapore, SingaporeKeisatsu Daigakko
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Authors:
- Verhoeff, L
- VERBURG, D J
- Lupker, H A
- Kusters, Leo J J
- Conference:
- Publication Date: 2000
Language
- English
Media Info
- Pagination: p. 369-375
Subject/Index Terms
- TRT Terms: Advanced vehicle control systems; Simulation
- Subject Areas: Operations and Traffic Management;
Filing Info
- Accession Number: 00817781
- Record Type: Publication
- Source Agency: UC Berkeley Transportation Library
- Files: PATH
- Created Date: Oct 31 2001 12:00AM