SCANNING ELECTRON MICROGRAPHY AND PHOTOGRAMMETRY

With the growing need for serious quantitative investigations with scanning electron microscope (SEM) micrographs, more attention is being to statistically sound metric calibration of the SEM system and to a general understanding of the inherent distortions in the SEM micrographs. By using the basic concept of collinearity condition with respect to perspective and parallel projections and an advanced photogrammetric self-calibration technique, one obtains the patterns of scale, radial, tangential, and spiral distortions. These are discussed and the corresponding mathematical models are presented. Results of recent research at The Ohio State University are presented.

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  • Corporate Authors:

    American Society of Photogrammetry

    105 North Virginia Avenue
    Falls Church, VA  United States  22046
  • Authors:
    • Ghosh, Soumya K
    • Nagaraja, H
  • Publication Date: 1976-5

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Filing Info

  • Accession Number: 00139262
  • Record Type: Publication
  • Files: TRIS
  • Created Date: Sep 16 1976 12:00AM