Two nondestructive composition analyzers based on measuring the characteristic fluorescent X rays from test samples by means of solid state detectors are decribed and compared with other currently in-use industrial X-ray systems. The advantages of using solid-state dectors rather than diffracting crystal systems to measure characteristic X rays are reflected in the real-time high through-put analysis requirements of modern manufacturing operations. The two elemental X-ray analyzers described include a system to measure lead concentration directly from the rough cut surfaces of free machining steel samples. The lead analyzer is designed around a high purity geranium detector which measures the high energy K sub alpha X rays from the lead. Lead concentration is read from a lighted display in a matter of seconds following sample insertion. In the other systems described, the elemental composition of jet engine turbine blades is measured at a rate of several hundred blades per hour by a silicon X-ray detector. Blades that are not within compositional specifications are automatically rejected. For both systems described emphasis is placed on real-time analysis, simplicity of operation and minimal sample preparation. /Author/

  • Availability:
  • Supplemental Notes:
    • Presented at the National Spring Conference of the American Society for Nondestructive Testing, 11-14 March 1974, Los Angeles.
  • Corporate Authors:

    American Society for Nondestructive Testing

    914 Chicago Avenue
    Evanston, IL  United States  60202
  • Authors:
    • Trice, J B
    • DiColli, A J
    • Locker, R J
    • Granat, W G
  • Publication Date: 1975-5

Media Info

  • Features: Figures; Photos; References; Tables;
  • Pagination: p. 107-112
  • Serial:
    • Materials Evaluation
    • Volume: 33
    • Issue Number: 5
    • Publisher: American Society for Nondestructive Testing
    • ISSN: 0025-5327

Subject/Index Terms

Filing Info

  • Accession Number: 00096214
  • Record Type: Publication
  • Files: TRIS
  • Created Date: Jul 2 1975 12:00AM