FEASIBILITY OF THIN-FILM ELECTRON MICROSCOPY FOR STUDY OF FINE DEFECT STRUCTURE IN STEEL AFTER LOW CYCLE FATIGUE

Application of recent developments in thin-film transmission electron microscopy to specimens of ABS Class-C steel fractured by low cycle fatigue demonstrates that changes in fine defect structure can be clearly observed. It is concluded that this method is capable of revealing much information about the extent, magnitude and nature of low cycle fatigue damage in mild steel.

  • Supplemental Notes:
    • This document is available for review at the Department of Commerce Library, Main Commerce Building, Washington, D.C., under reference number ORA-05872-1-F.
  • Corporate Authors:

    University of Michigan, Ann Arbor

    College of Engineering
    Ann Arbor, MI  USA  48109
  • Authors:
    • Felbeck, D K
  • Publication Date: 1964-3

Media Info

  • Features: Photos;
  • Pagination: 8 p.

Subject/Index Terms

Filing Info

  • Accession Number: 00026906
  • Record Type: Publication
  • Source Agency: Maritime Administration
  • Report/Paper Numbers: 05872-1-F
  • Contract Numbers: MA-2564
  • Files: TRIS, USDOT
  • Created Date: May 11 1973 12:00AM