FEASIBILITY OF THIN-FILM ELECTRON MICROSCOPY FOR STUDY OF FINE DEFECT STRUCTURE IN STEEL AFTER LOW CYCLE FATIGUE
Application of recent developments in thin-film transmission electron microscopy to specimens of ABS Class-C steel fractured by low cycle fatigue demonstrates that changes in fine defect structure can be clearly observed. It is concluded that this method is capable of revealing much information about the extent, magnitude and nature of low cycle fatigue damage in mild steel.
- This document is available for review at the Department of Commerce Library, Main Commerce Building, Washington, D.C., under reference number ORA-05872-1-F.
University of Michigan, Ann ArborCollege of Engineering
Ann Arbor, MI USA 48109
- Felbeck, D K
- Publication Date: 1964-3
- Features: Photos;
- Pagination: 8 p.
- TRT Terms: Cracking; Defects; Electron microscopy; Fatigue cracking; Materials tests; Steel; Structural deterioration and defects
- Old TRIS Terms: Steel testing
- Subject Areas: Marine Transportation; Materials;
- Accession Number: 00026906
- Record Type: Publication
- Source Agency: Maritime Administration
- Report/Paper Numbers: 05872-1-F
- Contract Numbers: MA-2564
- Files: TRIS, USDOT
- Created Date: May 11 1973 12:00AM