A simple microprocessor-based electronic aid to assist the operator of manual inspection systems is described. The problems of probe-positioning and a-scan interpretation are solved by using a surface-wave positioning unit and electronic processing of defect data. In this way a larger number of individual measurements on a particular defect can be made with a subsequent improvement in accuracy. Also due to the electronic processing a hard copy output is readily available either as a plotted graph or printed data.(a) (TRRL)

  • Corporate Authors:

    IPC Science and Technology Press Limited

    IPC House, 32 High Street
    Guildford, Surrey  England 
  • Authors:
    • McNab, A
    • Rushbrook-Williams, SJC
  • Publication Date: 1981-3

Media Info

  • Features: Figures; References;
  • Pagination: p. 63-66
  • Serial:
    • Ultrasonics
    • Volume: 19
    • Issue Number: 2
    • Publisher: Butterworth Scientific Limited

Subject/Index Terms

Filing Info

  • Accession Number: 00335027
  • Record Type: Publication
  • Source Agency: Transport Research Laboratory
  • Files: ITRD, TRIS
  • Created Date: Sep 16 1981 12:00AM