A NEW METHOD FOR THE EXPLORATION AND MEASUREMENT OF CRACK GROWTH USING A THIN CONDUCTOR FILM

A method has been developed in which the length of a crack on any metallic or non-metallic surface can be measured in situ, simply and at low cost. This is done by applying A thin, conducting film to the surface and then measuring the increase in voltage that occurs as the crack lengthens.(a) (TRRL)

  • Corporate Authors:

    IPC Science and Technology Press Limited

    IPC House, 32 High Street
    Guildford, Surrey  England 
  • Authors:
    • Gueury, M J
    • Dieudonne, R V
  • Publication Date: 1979-6

Media Info

  • Features: Figures; References; Tables;
  • Pagination: p. 121-124
  • Serial:
    • NDT International
    • Volume: 12
    • Issue Number: 3
    • Publisher: IPC Science and Technology Press Limited

Subject/Index Terms

Filing Info

  • Accession Number: 00329708
  • Record Type: Publication
  • Source Agency: Transport Research Laboratory
  • Files: ITRD, TRIS
  • Created Date: Oct 28 1981 12:00AM