SPECTRAL COMPOSITIONAL IMAGING OF SILICATE ROCKS

A TECHNIQUE IS PRESENTED FOR THE BROAD-SCALE MAPPING OF GROSS COMPOSITIONAL DIFFERENCES IN SILICATE ROCKS FROM THREE MEDIUM-WIDTH (2 TO 3 MICRONS) SPECTRAL CHANNELS OF THERMAL INFRARED SCANNER DATA. RATIOS OF RADIANCES IN TWO OF THE CHANNELS AS MEASURED BY A TWO-ELEMENT MERCURY-CADMIUM- TELERIUM DETECTOR (APPROXIMATELY 8.2 - 10.9 AND 9.4 - 12.1 MICRONS AT 10% RESPONSIVITY POINTS) FROM AN ALTITUDE OF 1000 METERS ARE CALCULATED FOR 25 SILICATE ROCKS. UNLIKE VEGETATION AND MOST OTHER ROCKS, SILICATES CHARACTERISTICALLY DISPLAY BROAD EMISSIVITY MINIMUMS (RESTSTRAHLEN BANDS) IN THE 8 - 12 MICRON WAVELENGTH REGION. THE TWO CHANNEL RADIANCE RATIOS ARE SHOWN TO BE NEARLY LINEARLY CORRELATED WITH THE POSITION OF THE CENTERS OF THE RESTSTRAHLEN SPECTRAL EMISSIVITY FEATURES, AS MEASURED IN THE LABORATORY. THE RATIOS ARE SHOWN TO BE GENERALLY CORRELATED WITH SIO2 CONTENT OF SILICATE ROCKS. A THIRD CHANNEL IS PROPOSED FOR CORRECTION OF TEMPERATURE VARIATIONS ACROSS THE SCENE.

  • Authors:
    • Vincent, R K
    • Thomson, F
  • Publication Date: 1972-5-10

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Filing Info

  • Accession Number: 00230120
  • Record Type: Publication
  • Files: TRIS
  • Created Date: Jul 17 1972 12:00AM