THICKNESS GAUGING USING BACK-SCATTERING OF ELECTRONS

Using a Sr-90 beta source and an ionization chamber to detect the electrons back-scattered from a thin specimen, it has been found that under suitable geometrical conditions thickness variation as small as 1 mg/sq cm of paper can be measured. The advantage of using the back-scattering method for the thickness determination is that only one source of high energy electrons is sufficient. The method is applicable to plastic and metallic foils and to metal coatings.

  • Corporate Authors:

    Publications & Information Directorate

    122 East 55th Street
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  • Authors:
    • Aditya, P K
    • Batra, A K
  • Publication Date: 1969-4

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Filing Info

  • Accession Number: 00007075
  • Record Type: Publication
  • Source Agency: Engineering Index
  • Files: TRIS
  • Created Date: Dec 22 1970 12:00AM