THICKNESS GAUGING USING BACK-SCATTERING OF ELECTRONS

Using a Sr-90 beta source and an ionization chamber to detect the electrons back-scattered from a thin specimen, it has been found that under suitable geometrical conditions thickness variation as small as 1 mg/sq cm of paper can be measured. The advantage of using the back-scattering method for the thickness determination is that only one source of high energy electrons is sufficient. The method is applicable to plastic and metallic foils and to metal coatings.

• Corporate Authors:

  Publications & Information Directorate

  122 East 55th Street
  New York, NY  United States  10022
• Authors:
  • Aditya, P K
  • Batra, A K
• Publication Date: 1969-4

Media Info

• Pagination: p. 226-228
• Serial:
  • Indian Journal of Pure & Applied Physics
  • Volume: 7
  • Issue Number: 4
  • Publisher: Publications & Information Directorate

Subject/Index Terms

• TRT Terms: Coatings; Measurement
• Old TRIS Terms: Coating measurement
• Subject Areas: Marine Transportation; Materials;

Filing Info

• Accession Number: 00007075
• Record Type: Publication
• Source Agency: Engineering Index
• Files: TRIS
• Created Date: Dec 22 1970 12:00AM