MICROSCOPE SPECTROSCOPY ON CONTAMINATED SOIL

This paper reports an investigation of metal contamination in soils using microscope spectroscopy. Soil samples from two metal contaminated industrial sites were subjected to bulk elemental analysis using X-ray Fluorescence Spectroscopy. These were further analysed using Scanning Electron Microscope Energy Dispersive X-ray Spectroscopy (SEM-EDS) and Laser Raman Microscopy (LRM). Sequential chemical extractions were carried out in order to give operational speciation for comparative purposes. Backscatter image intensity under the SEM shows that the lead contaminant in the first soil was concentrated on specific particles. EDS analysis using a 'thin-window' detector gave elemental compositions that were compatible with operational speciation data from sequential extractions. In the second soil, the chromium contaminant was evenly spread through the soil. As a result, EDS gave little information on chromium speciation as the Cr level was everywhere close to the EDS detection limit. Conversely, LRM gave no useful data on the first soil as it was difficult to selectively analyse the contaminated particles. It identified two discrete phases (sulphate and chromate) in the second soil, where the contamination level was relatively high. (A) For the covering abstract see IRRD 898792.

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  • Corporate Authors:

    Thomas Telford Limited

    London,   United Kingdom 
  • Authors:
    • JOHNSTON, S R
    • WEST, L J
    • STEWART, D I
  • Publication Date: 1997

Language

  • English

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Filing Info

  • Accession Number: 00752952
  • Record Type: Publication
  • Source Agency: Transport Research Laboratory
  • ISBN: 0-7277-2606-4
  • Files: ITRD
  • Created Date: Sep 28 1998 12:00AM