Correlating Long Term Chip Seal Performance and Rheological Properties of Laboratory-Aged and Field-Aged Binders

Two most common distresses found in the chip seals are raveling and bleeding. Although raveling is a process that continues throughout the whole service life of the chip seals, current performance test available for chip seals focuses mainly on early raveling and bond maturation. Chip seals binders are exclusively susceptible to aging because it lies on the top layer and experience the highest temperature and oxygen exposure. Over long periods of time the binder continues to oxidize and as a result it becomes brittle and its aggregate retention capacity decreases. In this study, chip seals binders from the field were extracted and recovered for consecutive two years (3rd and 4th 9 summer). Rheological properties of original, field-aged and laboratory-aged binders were compared. Results showed that pressure aging vessel (PAV)-aging may simulate the field stiffness (3 to 4 years for hot asphalt and much less than 3 years for emulsion) to a fair accuracy but cannot simulate other rheological properties exhibited through strain sweep results and multiple stress and creep recovery results similar to field-aged sample. In this study, strain tolerance, shear stress at failure (maximum shear stress), oxidative aging index and yield energy of the binder were correlated with long term field performance (raveling). Shear stress at failure of field-aged binders showed strong correlation with long term field performance, exhibiting a R2 value of 0.95. However, Yield energy (a product of strain tolerance and shear stress at failure) of original binder, which showed a R² value of 0.83 with long term field distress rating (raveling), was recommended as performance parameter for chip seals binder.

• Supplemental Notes:
  • This paper was sponsored by TRB committee AFK20 Characteristics of Asphalt Materials. Alternate title: Correlating Long-Term Chip Seal Performance and Rheological Properties of Laboratory-Aged and Field-Aged Binders
• Corporate Authors:

  Transportation Research Board

  500 Fifth Street, NW
  Washington, DC  United States  20001
• Authors:
  • Islam, Readul Mohammad
  • King Jr, William Bill
  • Wasiuddin, Nazimuddin M
• Conference:
  • Transportation Research Board 94th Annual Meeting
  • Location: Washington DC, United States
  • Date: 2015-1-11 to 2015-1-15
• Date: 2015

Language

• English

Media Info

• Media Type: Digital/other
• Features: Figures; References; Tables;
• Pagination: 17p
• Monograph Title: TRB 94th Annual Meeting Compendium of Papers

Subject/Index Terms

• TRT Terms: Aging (Materials); Binders; Chip seals; Field tests; Laboratory tests; Pavement performance; Rheological properties; Shear stress
• Uncontrolled Terms: Aged binder
• Subject Areas: Highways; Maintenance and Preservation; Materials; Pavements; I30: Materials; I60: Maintenance;

Filing Info

• Accession Number: 01551969
• Record Type: Publication
• Report/Paper Numbers: 15-3519
• Files: TRIS, TRB, ATRI
• Created Date: Jan 29 2015 9:17AM