MEASURING AND MINIMIZING DIODE DETECTOR NONLINEARITY

The paper describes a technique for measuring the linearity of amplitude detectors in general, and for measuring the deviation from square-law, E, of point-contact diode detectors in particular. A general mathematical model is given for determining the rf input power as a function of the detector output voltage. For point-contact diodes it is shown how to choose the video load resistance to minimize E, as well as how to calculate and correct for E.

• Supplemental Notes:
  • Sponsored in part by School of Aerospace Medicine, Brooks AFB, Tex. Pub. in CPEM Digest, p108-109 1976.
• Corporate Authors:

  National Bureau of Standards

  Gaithersburg, MD  United States 

  School of Aerospace Medicine

  2507 Kennedy Circle
  Brooks Air Force Base, TX  United States  78235
• Authors:
  • Hoer, C A
  • Roe, K C
  • Allred, C M
• Publication Date: 1976

Media Info

• Pagination: 3 p.

Subject/Index Terms

• TRT Terms: Diodes; Linearity; Mathematical models; Microwaves; Radio equipment; Radio frequency identification; Semiconductor devices; Semiconductors
• Old TRIS Terms: Crystal detectors; Microwave frequencies
• Subject Areas: Materials;

Filing Info

• Accession Number: 00147309
• Record Type: Publication
• Source Agency: National Technical Information Service
• Report/Paper Numbers: NBS2763433, NBS2763403
• Files: NTIS
• Created Date: Mar 15 2002 12:00AM