DEVELOPMENT AND APPLICATION OF AN INTERFEROMETRIC SYSTEM FOR MEASURING CRACK DISPLACEMENTS

The development of the first version of a minicomputer controlled system that converts the fringe pattern motion into a voltage output proportional to displacement is presented. Details of the instrument and the calibration tests are included. (Author)

• Corporate Authors:

  Michigan State University, East Lansing

  Division of Engineering Research
  East Lansing, MI  United States  48824
• Authors:
  • Sharpe, WNJ
• Publication Date: 1976

Media Info

• Pagination: 72 p.

Subject/Index Terms

• TRT Terms: Cracking; Diffraction; Fracture mechanics; Interferometers; Interferometry; Lasers; Measurement; Mineral dislocations; Stresses; Surfaces; Voltage
• Uncontrolled Terms: Stress concentration; Surface cracks
• Old TRIS Terms: Diffraction patterns; Laser applications; Photoplasticity; Voltage measurement
• Subject Areas: Geotechnology; Highways; Materials;

Filing Info

• Accession Number: 00154564
• Record Type: Publication
• Source Agency: National Technical Information Service
• Report/Paper Numbers: NASA-CR-145106 Final Rpt.
• Contract Numbers: NSG-1148
• Files: TRIS
• Created Date: May 31 1977 12:00AM