SCANNING ELECTRON MICROGRAPHY AND PHOTOGRAMMETRY
With the growing need for serious quantitative investigations with scanning electron microscope (SEM) micrographs, more attention is being to statistically sound metric calibration of the SEM system and to a general understanding of the inherent distortions in the SEM micrographs. By using the basic concept of collinearity condition with respect to perspective and parallel projections and an advanced photogrammetric self-calibration technique, one obtains the patterns of scale, radial, tangential, and spiral distortions. These are discussed and the corresponding mathematical models are presented. Results of recent research at The Ohio State University are presented.
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Availability:
- Find a library where document is available. Order URL: http://worldcat.org/issn/00991112
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Corporate Authors:
American Society of Photogrammetry
105 North Virginia Avenue
Falls Church, VA United States 22046 -
Authors:
- Ghosh, Soumya K
- Nagaraja, H
- Publication Date: 1976-5
Media Info
- Features: Figures; References; Tables;
- Pagination: p. 649-657
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Serial:
- Photogrammetric Engineering and Remote Sensing
- Volume: 42
- Issue Number: 5
- Publisher: American Society for Photogrammetry and Remote Sensing
- ISSN: 0099-1112
Subject/Index Terms
- TRT Terms: Calibration; Electron micrographs; Mathematical models; Photogrammetry; Scanners; Structural distortion
- Old TRIS Terms: Distortion; Scanning
- Subject Areas: Design; Highways;
Filing Info
- Accession Number: 00139262
- Record Type: Publication
- Files: TRIS
- Created Date: Sep 16 1976 12:00AM