TRANSIENT ANALYSIS
The use of the Optical Multichannel Analyzer (OMA) for the quantitative analysis of energy levels found in transient or non-constant light sources is described. This device is a modular electro-optical signal processing system for the breakdown of light into its components. The image tubes used in the OMA are gated silicon vidicons, or the more sensitive gated Silicon Intensified Target (SIT) detectors. The device is applicable in the field screening of materials in the metals industry as well as in many other fields ranging from satellite tracking to laser-induced fusion measurements.
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Authors:
- Osten, D E
- Publication Date: 1975-10
Media Info
- Features: Figures;
- Pagination: 5 p.
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Serial:
- Industrial Research
- Volume: 17
- Issue Number: 10
- Publisher: Dun Donnelley Publishing Corporation
Subject/Index Terms
- TRT Terms: Circuit analyzers; Detectors; Electrooptic materials; Metals; Nondestructive tests; Optical instruments; Optical measurement; Signalization; Silicon
- Uncontrolled Terms: Electrooptical devices; Signal analysis
- Old TRIS Terms: Analyzers /electric/; Multichannels
- Subject Areas: Geotechnology; Highways; Materials;
Filing Info
- Accession Number: 00127471
- Record Type: Publication
- Files: TRIS
- Created Date: Nov 18 1975 12:00AM