Development of High-speed Test Facility for Pantograph/OCL Systems

The Railway Technical Research Institute (RTRI) has developed a new pantograph test facility, the “High-Speed Test Facility for Pantograph/OCL Systems,” to develop pantographs for high-speed trains, wear resistant contact strips, and so on. This test facility mainly consists of four parts: a rotational disk with attached contact wire which can rotate at high speed up to 500 km/h, exciters which reproduce lateral arrangement and vertical movement of overhead contact lines (OCL), an energizing device which applies large current to a pantograph up to 1000 A, and environmental control devices which can control temperature from -20 to +40°C and humidity from 10% to 90% in test chamber. This paper shows the function, performance, and usage example of this test facility.


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  • Accession Number: 01852142
  • Record Type: Publication
  • Source Agency: Japan Science and Technology Agency (JST)
  • Files: TRIS, JSTAGE
  • Created Date: Jul 21 2022 11:30AM