Development of High-speed Test Facility for Pantograph/OCL Systems
The Railway Technical Research Institute (RTRI) has developed a new pantograph test facility, the “High-Speed Test Facility for Pantograph/OCL Systems,” to develop pantographs for high-speed trains, wear resistant contact strips, and so on. This test facility mainly consists of four parts: a rotational disk with attached contact wire which can rotate at high speed up to 500 km/h, exciters which reproduce lateral arrangement and vertical movement of overhead contact lines (OCL), an energizing device which applies large current to a pantograph up to 1000 A, and environmental control devices which can control temperature from -20 to +40°C and humidity from 10% to 90% in test chamber. This paper shows the function, performance, and usage example of this test facility.
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Availability:
- Find a library where document is available. Order URL: http://worldcat.org/issn/00339008
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Supplemental Notes:
- © 2022 by Railway Technical Research Institute.
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Authors:
- Koyama, Tatsuya
- Publication Date: 2022
Language
- English
- Japanese
Media Info
- Media Type: Web
- Features: References;
- Pagination: pp 128-132
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Serial:
- Quarterly Report of RTRI
- Volume: 63
- Issue Number: 2
- Publisher: Railway Technical Research Institute
- ISSN: 0033-9008
- EISSN: 1880-1765
- Serial URL: https://www.jstage.jst.go.jp/browse/rtriqr/-char/en
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Publication flags:
Open Access (libre)
Subject/Index Terms
- TRT Terms: Contact wire; Environmental control; High speed rail; Pantographs; Rolling contact; Test facilities
- Subject Areas: Railroads; Research; Vehicles and Equipment;
Filing Info
- Accession Number: 01852142
- Record Type: Publication
- Source Agency: Japan Science and Technology Agency (JST)
- Files: TRIS, JSTAGE
- Created Date: Jul 21 2022 11:30AM