Spectral analysis applied to the characterization of a surface profile

Surface profiles of five different types of aggregate have been obtained using a stylus type of instrument. The profiles have been modelled as random processes, superimposed on a systematic process in the form y = s(x) + u(x). The random process u(x), has been characterized by parameters derived from the spectral density function, and it has been shown, that highly statistically significant differences occur between the spectral density parameters of the five types of aggregate. It is concluded, that characteristic parameters of the spectral density function, are useful measures of surface texture which are unique to a particular surface (a).

• Availability:
  • Find a library where document is available. Order URL: http://worldcat.org/isbn/0909796084
• Authors:
  • Jones, R A
  • Guirguis, S
• Conference:
  • International Conference on Applications of Statistics And Probability in Soil and Structural Engineering, 3rd, 1979, Sydney, Australia
• Publication Date: 1979

Language

• English

Media Info

• Pagination: 39-45
• Serial:
  • Volume: 1

Subject/Index Terms

• TRT Terms: Aggregates; Measuring instruments; Texture
• ATRI Terms: Aggregate; Density; Measuring equipment; Surface texture
• Subject Areas: Geotechnology;

Filing Info

• Accession Number: 01438022
• Record Type: Publication
• Source Agency: ARRB
• ISBN: 0909796084
• Files: ATRI
• Created Date: Aug 24 2012 9:20PM