X-RAY EMISSION ANALYSIS OF PAINTS BY THIN FILM METHOD

SERIOUS MATRIX EFFECTS ENCOUNTERED IN THE X-RAY ANALYSIS OF PAINTS ARE ESSENTIALLY ELIMINATED BY USE OF A SPECIAL COMBINATION OF LIGHT, ELEMENT DILUTION, INTERNAL STANDARD, AND THIN FILM TECHNIQUES. /AUTHOR/

• Availability:
  • Find a library where document is available. Order URL: http://worldcat.org/issn/00332700
• Supplemental Notes:
  • Vol 41, No 13, PP 1858-1861, 4 FIG, 2 TAB, 9 REF
• Authors:
  • Mcginness, J D
  • Scott, R W
  • Mortensen, J S
• Publication Date: 1969-11

Media Info

• Serial:
  • Analytical Chemistry
  • Publisher: American Chemical Society
  • ISSN: 0033-2700

Subject/Index Terms

• TRT Terms: Paint; Thin films; X ray analysis
• Subject Areas: Geotechnology; Highways; Materials;

Filing Info

• Accession Number: 00217138
• Record Type: Publication
• Files: TRIS
• Created Date: Jul 18 1971 12:00AM